用于Functional Test 的IC測試分類，具有高產(chǎn)能、高穩(wěn)定性。支持IC芯片在不同的溫度（常溫、高溫、低溫）環(huán)境下，進行16site 并行測試分選。可實現(xiàn)高精度的溫度控制。
| Model | EXCEED8008 | EXCEED8016 | EXCEED8008H | EXCEED8016H |
|---|---|---|---|---|
| Test Layout | 1/2/4/8 site | 1/2/4/8/16 site | 1/2/4 site | 1/2/4/8/16 site |
| Air Supply | 0.5Mpa,450L/min | 0.5Mpa,550L/min | 0.5Mpa,450L/min | 0.5Mpa,550L/min |
| Power Supply | Single phase 220V 50/60Hz 30A | Single phase 220V 50/60Hz 30A*2 | ||
| Temp type | Ambient temp | High/Ambient temp | ||
| Pick-up head | 2x4 module | |||
| UPH | Max.13500 | |||
| Index Time | Min.420ms | |||
| Contact Force | 240KG (Option: 480KG) | |||
| SOCKET Opening | 300mmx135 mm | |||
| Dimension | 2000Lx1490Wx2200H(mm) | |||
| Weight | Appox.1500kg | |||
| PKG Type | QFN,QFP,BGA,LGA,PLCC,PGA, CSP,TSOP etc. | |||
| PKG Size | From 2x2 to 70x70 mm | |||
| Jam Rate | <1 /10000 | |||
| Tray Type | Jdec | |||
| Temp Range | +50degC to +100degC ±2degC; +100degC to +130degC ±3degC | |||
| Num Of Sorting | Auto Tray×3，F(xiàn)ix Tray×3 | |||
| Tester Interface | GPIB ,TTL, RS232 ,Network | |||
